Measurement of charge carrier mobility in perovskite nanowire films by photo-celiv method - Université d'Angers Accéder directement au contenu
Article Dans Une Revue Proceedings of the Romanian Academy - Series A (Mathematics, Physics, Technical Sciences, Information Science) Année : 2017

Measurement of charge carrier mobility in perovskite nanowire films by photo-celiv method

A. Aukštuolis
  • Fonction : Auteur
Mihaela Girtan
G.A. Mousdis
  • Fonction : Auteur
M. Socol
  • Fonction : Auteur
M. Rasheed
  • Fonction : Auteur
A. Stanculescu
  • Fonction : Auteur

Résumé

In this paper the holes' mobility for the configuration FTO/TiO2/CH3NH3PbI3/Spiro-MeOTAD/Au was measured for the first time by the Photo-CELIV method. The TiO2 dense film was deposited by reactive sputtering at room temperature on FTO glass substrates. High crystalized perovskite films were deposited from solutions in one step by spin coating. Spiro-MeOTAD molecular glass was used as holes transporting layer. The highest holes' mobility from TiO2 thin film through the perovskite and Spiro MeOTAD film to the top gold electrode was of order 8.5×10-7 cm2/Vs.
Fichier principal
Vignette du fichier
2017-Proc-Ro-Acad-M.Girtan-Aukstuolis.pdf (532.46 Ko) Télécharger le fichier
Origine : Accord explicite pour ce dépôt

Dates et versions

hal-02443179 , version 1 (22-04-2021)

Identifiants

  • HAL Id : hal-02443179 , version 1

Citer

A. Aukštuolis, Mihaela Girtan, G.A. Mousdis, R. Mallet, M. Socol, et al.. Measurement of charge carrier mobility in perovskite nanowire films by photo-celiv method. Proceedings of the Romanian Academy - Series A (Mathematics, Physics, Technical Sciences, Information Science), 2017, 18 (1), pp.34-41. ⟨hal-02443179⟩

Collections

UNIV-ANGERS LPHIA
355 Consultations
282 Téléchargements

Partager

Gmail Facebook X LinkedIn More