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Article Dans Une Revue Technology Letters Année : 2014

XPS Study of the Band Alignment at the Interface ITO/CuI

Christian Bernède
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Linda Cattin
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Padmanabhan Predeep
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Résumé

The band alignment at the interface of an ITO/CuI heterojunction is studied by X-ray photoelectron spectroscopy (XPS). The measurements have been performed on samples obtained under the same experimental conditions as those used to achieve organic photovoltaic cells. The CuI upper layer was 3 nm thick. The semidirect XPS technique used to measure the band offsets allows us to estimate the band discontinuities at the interface ITO/CuI: ΔEv = 2.10 eV and ΔEc = 1.56 eV. This band alignment induces an increase of the work function of the anode when the structure ITO/CuI is used as electrode in organic solar cells for instance. As a matter of fact, the measurement, by means of a Kelvin probe, of the work function of the structures ITO/CuI, shows that it is significantly higher than that of ITO alone: 5.2 eV and 4.8 eV.  

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Chimie
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Dates et versions

hal-03350374 , version 1 (21-09-2021)

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  • HAL Id : hal-03350374 , version 1
  • OKINA : ua12270

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Christian Bernède, Linda Cattin, Padmanabhan Predeep. XPS Study of the Band Alignment at the Interface ITO/CuI. Technology Letters, 2014, 1 (1), pp.2-10. ⟨hal-03350374⟩
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