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Relationship between structure and optical properties in rare earth-doped hafnium and silicon oxides: Modeling and spectroscopic measurements

Abstract :

The SiO2–HfO2 binary system is recognized as a promising candidate for Erbium-doped waveguides amplifiers fabrication. Recently, it was demonstrated that Er3+-activated 70SiO2–30HfO2 planar waveguides with valuable optical and structural properties can be prepared by sol–gel technique with dip-coating processing. The important role played by hafnium in the silica network was evidenced by the particular spectroscopic properties presented by Er3+-ions in the silica–hafnia planar waveguides. In this work we present preliminary results on HfO2–SiO2 bulk xerogels doped with Eu3+ ions, with the aim to go inside the role of hafnium on the rare earth ions local environment. Spectroscopic measurements of the Eu3+ photoluminescence emission are given. Numerical simulations by the molecular dynamics method have been performed showing clearly a phase separation for the HfO2 richer samples. Moreover it is found than the rare earth-doping ions stay preferentially in hafnium rich domains, thus explaining why the rare earth spectroscopic properties are strongly modified.

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https://hal.univ-angers.fr/hal-03423785
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Soumis le : mercredi 10 novembre 2021 - 11:05:55
Dernière modification le : mercredi 24 août 2022 - 18:29:06
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André Monteil, Mohamed El Jouad, G. Alombert-Goget, Stéphane Chaussedent, Nathalie Gaumer, et al.. Relationship between structure and optical properties in rare earth-doped hafnium and silicon oxides: Modeling and spectroscopic measurements. Journal of Non-Crystalline Solids, Elsevier, 2008, 354 (42–44), pp.4719-4722. ⟨10.1016/j.jnoncrysol.2008.04.047⟩. ⟨hal-03423785⟩

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