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Communication Dans Un Congrès Année : 2011

Lifetime estimation of a photovoltaic module based on temperature measurement

Résumé

In the building domain, components orequipment are often subjected to severe environmental conditions. In order to predict the reliability and the lifetime of such equipment, accelerated life testing can be carried out. Severe conditions are applied to accelerate the ageing of the components and the reliability at nominal conditions is then deduced considering that these nominal conditions are not constant but stochastic. In this paper, the accelerated life testing of photovoltaic modules is carried out at severe module temperature levels. The module power losses are monitored and the limit state is determined when a threshold power is reached. The stochastic data and the reliability are simulated during a period of fifty years. Finally, the lifetime of the component is evaluated.

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Dates et versions

hal-03428286 , version 1 (15-11-2021)

Identifiants

  • HAL Id : hal-03428286 , version 1
  • OKINA : ua1649

Citer

Rémi Laronde, Abderafi Charki, David Bigaud. Lifetime estimation of a photovoltaic module based on temperature measurement. 2nd IMEKO TC 11 International Symposium METROLOGICAL INFRASTRUCTURE, IMEKO-MI 2011, 2011, Cavtat, Croatia. ⟨hal-03428286⟩

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