Many photovoltaic modules are installed all around the world. However, the reliability of this product is not enough really known. The electrical power decreases in time due mainly to corrosion, encapsulation discoloration and solder bond failure. The failure of a photovoltaic module is obtained when the electrical power degradation reaches a threshold value. Accelerated life tests are commonly used to estimate the reliability of the photovoltaic module. However, using accelerated life tests, few data on the failure of this product are obtained and the realization of this kind of tests is expensive. As a solution, an accelerated degradation test can be carried out using only one stress if parameters of the acceleration model are known. The Wiener process associated with the accelerated failure time model permits to carry out many simulations and to determine the failure time distribution when the threshold value is reached. So, the failure time distribution and the lifetime (mean and uncertainty) can be evaluated.